Elaboration and characterization of a thin SiNx interfacial layer between the silicon and the anti-reflection layer to improve the performance of solar panels. - Université Clermont Auvergne Accéder directement au contenu
Poster De Conférence Année : 2023

Elaboration and characterization of a thin SiNx interfacial layer between the silicon and the anti-reflection layer to improve the performance of solar panels.

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hal-04560188 , version 1 (26-04-2024)

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  • HAL Id : hal-04560188 , version 1

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H. Beji, E. Tomasella, C. Robert-Goumet. Elaboration and characterization of a thin SiNx interfacial layer between the silicon and the anti-reflection layer to improve the performance of solar panels.. Journées scientifiques de l’Ecole Doctorale Sciences Fondamentales, Mar 2023, Aubière, France. ⟨hal-04560188⟩
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