In-situ measurements of magmatic volatile elements, F, S, and Cl, by electron microprobe, secondary ion mass spectrometry, and heavy ion elastic recoil detection analysis - Université Clermont Auvergne Accéder directement au contenu
Article Dans Une Revue The American Mineralogist Année : 2020

In-situ measurements of magmatic volatile elements, F, S, and Cl, by electron microprobe, secondary ion mass spectrometry, and heavy ion elastic recoil detection analysis

Résumé

Electron probe and ion probe are the two most used instruments for in situ analysis of halogens in geological materials. The comparison of these two methods on widely distributed glass standards (example: MPI-DING glasses, Jochum et al., G-cubed, 2006) provides a basis for establishing laboratory method, independent geochemical data sets for these elements. We report analyses of F, S, and Cl concentrations in three geological glass samples (EPMA) and 10 referenced standards (EPMA and SIMS). Furthermore, F and Cl absolute abundances have been determined independently for three of the standards (KL2-G, ATHO-G, and KE12), via heavy ion elastic recoil detection analysis (HIERDA), to certify the accuracy of the cross-calibration EPMA-SIMS. The detection limits for EPMA are a 150 mg·g-1 for F, 20 mg·g-1for S and Cl, and for SIMS < 48 mg·g-1 for F, < 3 mg·g-1 for S, and <19 mg·g-1 for Cl. On SiO2-rich glass-standards, F and Cl measurements by HIERDA highlight a weak matrix effect during SIMS analy-sis of F and Cl. With the HIERDA independently measured value, we therefore propose an alternative calibration function to empirically correct this matrix effect on the SIMS measurements of F, S, and Cl.
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hal-02930778 , version 1 (10-11-2020)

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Estelle F. Rose-Koga, Kenneth T. Koga, Jean-Luc Devidal, Nobumichi Shimizu, Marion Le Voyer, et al.. In-situ measurements of magmatic volatile elements, F, S, and Cl, by electron microprobe, secondary ion mass spectrometry, and heavy ion elastic recoil detection analysis. The American Mineralogist, 2020, 105 (5), pp.616-626. ⟨10.2138/am-2020-7221⟩. ⟨hal-02930778⟩
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