Quantification of grain boundary mobilities in natural olivine by annealing experiments and full-field modelling - Université Clermont Auvergne Access content directly
Journal Articles Tectonophysics Year : 2024

Quantification of grain boundary mobilities in natural olivine by annealing experiments and full-field modelling

Abstract

We investigate olivine grain boundary (GB) migration in natural peridotites experimentally annealed at high pressure and high temperature, and couple the experimental observations to full-field grain growth models to provide the distribution of GB mobilities in natural olivine polycrystals. A stack of four slices of natural mylonitic peridotite (Oman ophiolite) was annealed at 1473 K for 5 h under a confining pressure of 300 MPa of argon in a Paterson press. The three sintered interfaces of the stack are characterized using scanning electron microscopy and electron backscatter diffraction (EBSD) to extract a distribution of apparent (2D) GB displacements. Full-field simulations of numerically sintered interfaces are then used to infer the GB mean mobility and distribution in olivine polycrystal allowing forward modelling exercise to reproduce the experimental GB displacement distribution. This yields widely dispersed mobilities, which can be approximated by a log-normal distribution of. Both the average and the dispersion of GB mobilities can be explained by silicon grain boundary diffusion. Finally, we demonstrate that the high variability of GB mobilities in olivine implies a decrease of the mean growth rate with time. This elucidates the difficulties of extrapolating experimental grain growth rates to geological timescales and observed microstructures in peridotites.
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Dates and versions

hal-04568961 , version 1 (06-05-2024)

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Jean Furstoss, Sylvie Demouchy, Andrea Tommasi, Emmanuel Gardés, Fabrice Barou, et al.. Quantification of grain boundary mobilities in natural olivine by annealing experiments and full-field modelling. Tectonophysics, 2024, pp.230333. ⟨10.1016/j.tecto.2024.230333⟩. ⟨hal-04568961⟩
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