A generic deep-learning based defect segmentation model for electron micrographs for automatic defect inspection
Julien Baderot
(1)
,
Ali Hallal
(2, 1)
,
Martin Jacob
(3, 1)
,
Vincent Barra
(2)
,
Arnaud Guillin
(3)
,
Sergio Martinez
(1)
,
Johann Foucher
(1)
Vincent Barra
- Function : Author
- PersonId : 171668
- IdHAL : vincent-barra
- ORCID : 0000-0002-8975-222X
- IdRef : 150156243
Arnaud Guillin
- Function : Author
- PersonId : 5334
- IdHAL : arnaud-guillin
- ORCID : 0000-0003-2393-6242
- IdRef : 035487976