Integrated DIC dedicated to residual stress identification in a beam subjected to milling - Université Clermont Auvergne
Communication Dans Un Congrès Année : 2020

Integrated DIC dedicated to residual stress identification in a beam subjected to milling

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hal-03172124 , version 1 (17-03-2021)

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  • HAL Id : hal-03172124 , version 1

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Théo Jovani, Hélène Chanal, Benoît Blaysat, Michel Grediac. Integrated DIC dedicated to residual stress identification in a beam subjected to milling. Photomechanics IDICS Conference, Oct 2020, Nantes, France. ⟨hal-03172124⟩
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